Supplier of photovoltaic cell efficiency loss analyzer

NegotiableUpdate on 01/16

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

Guangyan Technology QE-RX Photovoltaic Cell Efficiency Loss Analyzer can be used for the research and development of high-efficiency solar cells. QE-RX can not only measure PV-EQE, reflectance, and PV-IQE data, but also analyze Jsc, Voc, and FF losses by combining analysis software SQ-JVFLA. Guangyan integrated three different testing functions within QE-RX and developed SQ-JVFLA software to assist users in analyzing three different losses using Shockley Queisser thermal limit theory. QE-RX is you

Product Details

feature

QE-RXPhotovoltaic cell efficiency loss analyzer The characteristics are as follows:

*Highly accurate and low uncertainty

The calibration of QE-RX is traceable to NIST, which makes the uncertainty of QE-RX test data lower than any other EQE testing system. Meanwhile, QE-RX was developed by Enlitech, which has a 10-year ISO/IEC 17025 certified calibration laboratory. This makes the testing results of QE-RX for Si solar cells highly accurate. Relying on QE-RX, it will provide you with reliable results.

*Compact structure but diverse functions

QE-RX integrates all optical and mechanical components into an 80cm x 80cm x 60cm body, including an electrical signal acquisition lock-in amplifier. Not limited to its compact size, QE-RX still provides various test data, including EQE, spectral response, reflectivity, and IQE of solar cells. Compact and multifunctional are the advantages of QE-RX.

*Power loss analysis

QE-RX combined with SQ-JVFL software can provide the most complete analysis functions, including Jsc loss, Voc loss, FF loss, and bandgap calculation. These parameters are key factors for production yield control and efficiency recommendations, making QE-RX a partner in the photovoltaic industry.

Used for PESC, PERC, PERL, HJT, back contact, double-sided, and TOP Con silicon solar cells

Provide data on QE (quantum efficiency), PV-EQE (external quantum efficiency), IPCE (incident photon electron conversion efficiency), SR (spectral response), IQE (internal quantum efficiency), and reflectivity.

Compact structure with high repeatability exceeding 99.5%.

Wavelength range: 300~1200 nm

Jsc loss analysis and reporting (using SQ-JVFLA software).

Occupational loss analysis and reporting (using SQ-JVFLA software).

F loss analysis and reporting (using SQ-JVFLA software).

The provided EQE uncertainty assessment report and quality control certified by ISO/IEC 17025 can be used for journal paper submissions.

Diversified and customized sample testing equipment.