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Hunan Greber Electronic Technology Co., Ltd

E-mail
billion.xiao@glb-et.com
Phone
18573116298
Address
Room 905, northwest corner of the intersection of Furong Road and Chengnan Road, Chengnan Road Street, Tianxin District, Changsha City, Hunan Province

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How much does the TLP transmission line pulse testing system cost

NegotiableUpdate on 01/21

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

The TLP transmission line pulse testing system is a portable pulse IV curve characteristic characterization system used to simulate electrostatic discharge pulse events, such as TLP, vf TLP, HMM, HBM, EFT, and low-voltage surges. The system will detect transient voltage and current waveforms at the picosecond or nanosecond level during the pulse period, and test the status of the tested device before and after the pulse (leakage current, breakdown voltage, bias current, static IV curve, etc.). The measurable DUTs include electrostatic protection devices, semiconductors, circuit modules, touch panel sensors, etc.

Product Details

The transmission line pulse (TLP) testing and analysis function of the system complies with the ANSI/ESD STM5.5.1-2014 testing standard. The ES620 system is capable of injecting high-quality rectangular wave pulses into the device, while recording the current flowing through the device and the voltage across the device. The test results can provide a pulsed IV curve, allowing users to characterize the transient response of the device at the nanosecond level. The system also has automated detection methods for device failure, such as leakage current testing, static IV curve, fuse and spark discharge.

The ultra fast TLP (vf TLP) testing and analysis functions comply with the ANSI/ESD SP5.5.2-2007 testing standard. Vf TLP testing is used to simulate the electrostatic discharge of CDM speed, capturing the current and voltage of the device at high speed (approximately 100ps rising edge). Users can test the response speed and peak voltage of the device through this method.

The testing and analysis function of the human body metal model (HMM) complies with the ANSI/ESD SP5.6-2009 testing method, which can replace the system level ESD testing method in IEC61000-4-2 for testing ICs. When testing low impedance devices or wafers, this testing function of the system can provide ideal waveforms that comply with the IEC61000-4-2 standard and avoid many problems that may occur during electrostatic discharge gun testing, such as poor repeatability, incorrect discharge position, EMI interference caused by unshielded relays, and the need to set up large grounding plates and coupling plates.

The system has complete software control, customizable rising edge time and pulse width, good compatibility with IVI instruments, and small size.

TLP transmission line pulse testing systemFeatures:

Flexible TLP IV Curve Pulse Testing and Analysis System

Ultra portable design

Ultra fast testing speed, parallel processing of programs

Currently, there are 25A, 50A, and 100A modules available for testing

High quality TLP pulses

Scalable testing modules include vf TLP, HMM, HBM, and low voltage surge

Automated fault detection methods include: DC spot checks (voltage or current), static IV, melting, breakdown, bias source fluctuations, and customer customization

Software controlled pulse injection: single, continuous, IV curve characterization

Rising edge options: 60ps to 50ns (depending on module)

Pulse width options: 1ns to 3200ns (depending on module)

TLP transmission line pulse testing systemApplication:

Wafer level ESD testing

PCB/Package Level ESD Testing

System/Circuit ESD Testing

Safe Workplace (SOA) Testing

Charging recovery time test

Differential ESD pulse injection

Touch screen ITO microstrip line melting test

Touch screen ITO microstrip line spark discharge test

TLP injection current pulse conforms to and exceeds ANSI/ESD STM 5.5.1-2008 standard

VF TLP injects current pulses that comply with and exceed the ANSI/ESD SP5.5.2-2007 standard

For low impedance devices, the injected current pulse of HMM matches the waveform of IEC61000-4-2

Specifications:

ES620 IV Curve Testing System Based on Transmission Line Pulse

parameter	ES620-25	ES620-50	ES620-100	unit	remark
Open circuit output voltage	±0.5~1250	±0.5~2500	±0.5~5000	V
Output voltage at 50 ohms load	±0.25–625	±0.5~1250	±0.5~2500	V
When the load is 50 ohms, the small voltage step is low voltage -40V	0.01	0.01	0.02	V	With 46dB reflection suppression
At a load of 50 ohms, the small voltage step is 40V to the high voltage	0.1	0.1	0.2	V	Equipped with 6dB reflection suppression
Output voltage error	<5%<>			%	After self calibration
Short circuit output current	±0.01~25	±0.02~50	±0.04~100	A
Output current at 50 ohms load	±0.005~12.5	±0.01~25	±0.02~50	A
Peak power at 50 ohms load	≥7.813	≥31.25	≥125	kW
Comes with TLP rising edge time	≤0.2	≤0.2	≤0.3	ns	ES620-25 can reach 60ps
Other rising edge time options	0.06~50			ns	Related to the model, please refer to Table 2
Comes with TLP pulse width	100±1			ns	customize
Other pulse width options	1~3200	5~1000	5~1000	ns	Related to the model, please refer to Table 3
Test interval time	Usually 0.2~2			s	Related to oscilloscopes, SMUs, and regulations
size	347X300X145			mm
weight	5	6	8	kg
I&V direct measurement	I&V direct measurement probe A6213-T1 (CT-2 current probe and 1KT voltage probe)
Can be equipped with oscilloscope	Most models of Tektronix, Agilent, LeCroy, Rigol				Other models can be matched and supported according to customer needs
Can be used with SMU	Keithley 24xx/26xx series SMU				Other models can be matched and supported according to customer needs

ES620-HMM1 Extended Human Body Metal Model Module (DUT Short Circuit, 100 Ω HMM, Based on ANSI/ESD SP5.6-2009 Standard)

parameter	ES620-25	ES620-50	ES620-100	unit	remark
HMM peak current	22.5	45	90	A	3.75A per kV ≤± 10% IEC 61000-4-2 (R=330 Ω， C=150pF)
HMM current at 30ns	12	24	48	A	≤± 10% (better than IEC's ± 30%)
HMM current at 60ns	6	12	24	A	≤± 10% (better than IEC's ± 30%)

ES620-HBM1 Extended Human Body Model Module (ANSI/ESDA/JEDEC JS-001-2014 R=1.5k Ω, C=100pF)

TLP传输线脉冲测试系统