ES640 Charge Device Model (CDM) testing system, where electrostatic discharge is a common cause of microelectronic circuit failures. The discharge of C DM at lower voltage can seriously damage or destroy sensitive equipment. This usually occurs when devices with static electricity come into contact with metal surfaces at different potentials. This type of electrostatic discharge typically has a very fast rise time.
ES640 Charging Device Model (CDM) Testing SystemIntroduction:
1. Description
The electrostatic discharge of the Charge Device Model (CDM) is a common cause of microelectronic circuit failures. CDM discharge at lower voltages can severely damage or destroy sensitive equipment. This usually occurs when devices with static electricity come into contact with metal surfaces at different potentials. This type of electrostatic discharge typically has a very fast rise time.
ES640 is an automated CDM tester that can meet all popular CDM testing methods, supporting Field Induced Air Discharge (FICDM) and Contact Discharge (LI-CCDM, CC-TLP, RP-CDCM) methods. This testing system includes a computer, an environmental control room, a precise XYZ motion control system, different types of CDM test heads, and automatic testing and data analysis software.
The following is a comparison between the ESDMEC ES640 CDM solution and other solutions, including the Thermo Scientific Orion3 CDM tester, Hanwa HED-C5000R, etc.
2. Characteristics
High resolution cameras (up to 3) can easily perform pin alignment operations
High resolution motion control system (step size as low as 1 µ m)
Allow batch testing of multiple devices
The CCDM method being applied for has better reproducibility
The enclosed environment chamber improves the efficiency of the drying unit
Support regeneration drying unit (no nitrogen required)
3. Application
Universal CDM system for packaging and wafer level testing
Supports many popular CDM methods:
ANSI/ESDA/JEDEC JS-002(FICDM)
AEC Q100-011 Rev-D (遵循JS-002)
AEC Q101-005 Rev-A (遵循 JS-002)
ANSI/ESD SP5.3.3 (LI-CCDM, 需要 vf-TLP)
CC-TLP (ESDA SP awaiting approval, requires vf TLP)
The RP-CDM method in our company's application
We can provide solutions that have been discontinued or customized according to customer requirements
Robot Charged Plate Model (CBM) and Flat ESD Testing with Customizable Sizes
4. Specifications
parameter |
ES640-150 |
ES640-300 |
unit |
remark |
XY testing area |
≥150X150 |
≥300X300 |
mm |
Probe movement area, customizable |
DUT area |
160X160 |
375X425 |
mm |
|
Charging pad area |
210X210 |
395X470 |
mm |
|
Z itinerary |
≥50 |
≥150 |
mm |
|
Minimum X, Y, Z step size |
100 |
nm |
|
Reset repeatability capability |
≤±6 |
μm |
|
Test voltage range |
± 1 to 2000 or 4000 |
V |
Default 2000V, customizable |
Test voltage step |
1 |
V |
|
Test voltage accuracy |
±1%±0.1V |
%V |
|
XY field of view resolution |
1920X1080 |
pixel |
|
Vertical field of view resolution |
2592X1944 |
pixel |
|
operating temperature |
10 to 40 |
°C |
|
Operating humidity (RH) |
10 to 80 |
% |
|
voltage |
120-240VAC,50/60Hz |
VAC |
|
N2 or CDA pressure |
10–120 |
PSI |
|
Peak usage of N2 or CDA |
0.2 |
cfm |
Or 0.34m3h |
Average usage of 300 N2 boxes |
~19 |
hour |
Continuous @ 40RH environment |
Average usage of desiccant |
~24 |
hour |
Continuous @ 40RH environment |
5. Ordering Information
serial number |
model |
description |
ES640 Charged Device Model (CDM) Testing System |
1.1 |
ES640-150 |
Universal CDM platform, 150X150mm testing area, 2kV |
1.2 |
ES640-300 |
Universal CDM platform, 300X300mm testing area, 2kV |
1.3 |
ES640-HC |
Humidity control unit for air discharge method (users can reuse desiccants, which have lower usage costs than N2 or CDA) |
1.4 |
ES640-CV4 |
The discharge voltage has been increased from 2kV to 4kV |
1.5 |
ES640-CPC |
Customized field board for fixing 200X300DUT |
1.6 |
ES640-VP1 |
Vacuum pump for fixing DUT (optional, software controlled) |
1.7 |
ES640-VP2 |
High pressure tip cleaning unit (optional, software controlled) |
ANSI/ESDA/JEDEC JS-002-2018 standard related configurations (including AEC_Q100-011D, AEC_Q101-005A, all comply with this standard) |
2.1 |
ES640-JS002 |
JS002 discharge unit |
2.2 |
ES640-JS002-C |
JS002/C101 Calibration Disk (Small and Large) |
2.3 |
ES640-JS002-P1 |
JS002 can replace Pogo Pin # 1 (diameter 0.35mm) |
Discontinued AEC standard related configurations (not recommended for new designs)ES640 Charging Device Model (CDM) Testing System |