JIMA Resolution Test Card Company from Japan

JIMA (Japan Testing Equipment Manufacturers Association) is committed to focusing on various testing instruments, including non-destructive testing instruments, JIMAResolution test card，

Used to measure the resolution of X-ray systems to ensure image quality at micro and nano focal points.

JIMA RT RC-02BResolution test cardEncapsulated in a protective box

Box dimensions (W × D × T): 40 × 30 × 15mm

Chip size (W × D × T): 5 × 5 × 0.06mm

Pattern layout: L-shaped

Line/Space Size: 16 specifications of patterns,

0.4μm,0.5μm,0.6μm,0.7μm,0.8μm,0.9μm,1.0μm,1.5μm,

2.0μm,3.0μm,4.0μm,5.0μm,6.0μm,7.0,10.0μm,15.0μm

JIMA RT RC-04 X-rayResolution test card

JIMA RT RC-05Resolution test card

JIMA RT RC-02BResolution test card, X-rayResolution test cardEncapsulated in a protective box

Box dimensions (W × D × T): 40 × 30 × 3mm

Chip size (W × D × T): 8 × 8 × 0.2mm

Pattern layout: T-shaped (3-10 μ m)

I 型 （15-50μm）

Line/Space Size: 16 specifications of patterns,

3μm,4μm,5μm,6μm,7μm,9μm,10μm （T 型）

15μm,20μm,25μm,30μm,35μm,40μm,45μm,50μm (I 型)

JIMA RT RC-05X-rayResolution test card,JIMA RT RC-04Resolution test card

The test card is packaged in a protective box

Box dimensions (W × D × T): 40 × 30 × 5mm

Chip size (W × D × T): 5 × 5 × 0.015mm

Pattern layout: T-shaped

Line/space dimensions: 32 types of pattern specifications,

0.1μm,0.15μm,0.2μm,0.25μm,0.3μm,0.35μm,0.4μm,0.5μm,0.6μm,0.7μm, 0.8μm,

0.9μm,1.0μm,1.5μm,2.0μm,3.0μm,4.0,5.0μm,6.0μm，7.0μm,8.0μm,9.0μm,10.0μm,

JIMAResolution test card, JIMA RT RC-02 X-rayResolution test card

JIMA RT CT-01Resolution test card(Dedicated to resolution testing of 3D CT systems)

RT RC-02BResolution test cardEncapsulated in a protective box

Pattern layout: T-shaped

Line/Space Size: 5 specifications of patterns,

3μm,4μm,5μm,6μm,7μm

SAG: RT RC-02B, RT RC-02B test card, RC-02B test card, JIMA RT RC-02B,Resolution test card, JIMA X-rayResolution test card