OPTM seriesMicroscopic spectrophotometer film thickness analyzer

By using microscopic spectroscopy to measure reflectance in small areas, high-precision film thickness/optical constant analysis can be performed.

The thickness of coatings can be measured through non-destructive and non-contact methods, such as various films, chips, optical materials, and multilayer films. In terms of measurement time, it can achieve high-speed measurement of 1 second per point, and is equipped with software that can easily analyze optical constants even for first-time users.

The head integrates the necessary functions for measuring film thickness

• High precision measurement of reflectance (multilayer film thickness, optical constants) using microspectroscopy

1:1 high-speed measurement

An optical system with a wide range of visible and differential light (ultraviolet to near-infrared)

Security mechanism of regional sensors

Easy to analyze guide, beginners can also perform optical constant analysis

Independent measuring heads correspond to various inline customization requirements

• Support various customizations

Measurement items:

•*Yes, that's rightReflectance measurement

Multi layer film analysis

Optical constant analysis (n: refractive index, k: extinction coefficient)

OPTM seriesMicroscopic spectrophotometer film thickness analyzer