Fully Automated Wafer Transfer Platform Company

NegotiableUpdate on 03/07

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

Ebona fully automatic wafer probe station is designed specifically for high-precision testing needs. Including a 6-inch sample stage (optional 8-inch), equipped with vacuum adsorption function, capable of 360 ° rotation, ensuring multi angle operational flexibility. The microscope section includes both solid and metallographic microscopes, supporting highly stable microscopic observations. In addition, this probe station is equipped with a high-quality Nikon CCD with 12.7 million pixels, providing users with clear image capture.

Product Details

Ebona fully automatic wafer probe stationProduct Introduction

The construction of the AiBona wafer probe station is exquisite, with a probe adjustment accuracy of 1 micron, equipped with RF lines and various types of connectors to meet different testing needs. Compatible with various types of probes, such as GGB probes from the United States, imported probes from South Korea, and domestically produced probes, ensuring a wide range of applications. The probe station is also equipped with a high-performance vacuum pump and a 27 inch 2K full HD professional display, providing users with a convenient operating experience and high-quality display effects. In addition, its control chassis integrates system three-axis electric motor control, making the sample heating table and vacuum adsorption function more precise and reliable.

Ebona fully automatic wafer probe stationProduct Features

1. Accuracy and control: The manual probe station can achieve precise control of 1 micrometer, ensuring accurate positioning at the micrometer scale.

2. Flexibility: When in use, the probe or sample stage can be manually rotated, up and down, left and right, or tilted to meet different experimental needs and adapt to the shape and size of different samples.

3. Real time feedback: Equipped with a microscope and Nikon CCD (visible to mid to near-infrared band), allowing for real-time observation of the relative position of the probe and sample, ensuring accurate alignment.

4. Simple operation: The design is intuitive, the operation is simple, and it is easy to get started.

5. Stability: The structural design is sturdy, made of high-quality materials, and the entire equipment is sealed and dust-free during measurement, ensuring long-term stable operation.

6. Compatibility: It can be used with various probes and optoelectronic measurement systems, and can be externally connected to picosecond and femtosecond lasers for photocurrent detection. Can be externally connected for optical non-destructive measurement such as Raman second harmonic.

7. Customizability: It can be customized according to specific user needs, such as the length and angle of the probe, as well as the size of the pedestal, to meet special application conditions.